SWIR camera with ultra-high resolution realized by CIS's patented piezo-actuator-based pixel shift technology. Capable of inspecting invisible part of objects with detection wavelength spectrum from 400~1700nm. On top of that, applying pixel-shifting technology to the 1.3M SWIR sensor, camera achieves max. 21M pixels. Complies with CoaXPress Ver. 1.1.1. and supports CXP-3 x1 lane. Suitable for various inspection applications such as wafer inspection, PCB inspection, food and agricultural products inspection, tablet inspection, and more.